Electron Microscopy
Nanoscale Imaging & Structural Analysis
Electron microscopy enables ultra-high-resolution imaging beyond optical limits, making it essential for materials science, nanotechnology, metallurgy, and semiconductor research.
Chemplanet supplies SEM, TEM, and compact desktop electron microscopes with full local support.
Electron Microscopy Systems
Scanning Electron Microscopy (SEM)
High-resolution surface morphology imaging combined with EDS for elemental analysis and material characterization.
Transmission Electron Microscopy (TEM)
Atomic-scale internal structure analysis, crystallography, and nanoscale defect characterization.
Desktop Electron Microscopes
Rapid analysis with minimal infrastructure requirements, perfect for quality control and routine inspections.
Example Electron Microscopes
SEM Systems:
- JEOL JSM-IT Series
- Thermo Scientific Phenom XL
- ZEISS EVO Series
- Hitachi SU3900/SU5000
TEM Systems:
- JEOL JEM-1400 Plus
- Thermo Scientific Talos
- JEOL JEM-F200
- Hitachi HT7800
Desktop SEM:
- Thermo Scientific Phenom ProX
- Hitachi TM4000Plus
- JEOL JCM-7000
- Thermo Scientific Prisma E
Key Benefits
Sub-nanometre Resolution
Unprecedented imaging detail beyond optical limitations
EDS Elemental Analysis
Integrated chemical composition mapping and identification
Automated Workflows
Streamlined operation with intelligent automation features
Compact Lab-Friendly Options
Space-efficient designs requiring minimal infrastructure
Unlock Nanoscale Insights with Electron Microscopy
Our team of electron microscopy specialists will help you select the perfect system for your research or quality control needs.